DocumentCode
951565
Title
Combined time and information redundancy for SEU-tolerance in energy-efficient real-time systems
Author
Ejlali, Alireza ; Al-Hashimi, Bashir M. ; Schmitz, Marcus T. ; Rosinger, Paul ; Miremadi, Seyed Ghassem
Author_Institution
Sharif Univ. of Technol., Tehran, Iran
Volume
14
Issue
4
fYear
2006
fDate
4/1/2006 12:00:00 AM
Firstpage
323
Lastpage
335
Abstract
Recently, the tradeoff between energy consumption and fault-tolerance in real-time systems has been highlighted. These works have focused on dynamic voltage scaling (DVS) to reduce dynamic energy dissipation and on-time redundancy to achieve transient-fault tolerance. While the time redundancy technique exploits the available slack-time to increase the fault-tolerance by performing recovery executions, DVS exploits slack-time to save energy. Therefore, we believe there is a resource conflict between the time-redundancy technique and DVS. The first aim of this paper is to propose the use of information redundancy to solve this problem. We demonstrate through analytical and experimental studies that it is possible to achieve both higher transient fault-tolerance [tolerance to single event upsets (SEUs)] and less energy using a combination of information and time redundancy when compared with using time redundancy alone. The second aim of this paper is to analyze the interplay of transient-fault tolerance (SEU-tolerance) and adaptive body biasing (ABB) used to reduce static leakage energy, which has not been addressed in previous studies. We show that the same technique (i.e., the combination of time and information redundancy) is applicable to ABB-enabled systems and provides more advantages than time redundancy alone.
Keywords
embedded systems; fault tolerance; real-time systems; redundancy; transients; SEU-tolerance; adaptive body biasing; embedded systems; energy-efficient real-time systems; information redundancy; single event upset tolerance; time redundancy; transient fault-tolerance; Dynamic voltage scaling; Energy consumption; Energy dissipation; Energy efficiency; Fault tolerance; Fault tolerant systems; Information analysis; Real time systems; Redundancy; Voltage control; Embedded systems; energy efficiency; fault tolerance; single event upsets;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2006.874355
Filename
1637463
Link To Document