Title :
Open-circuit to short-circuit switching: method for lifetime measurement in solar cells
Author :
Dhariwal, S.R. ; Basu, Niranjan ; Gadre, Ranjana
Author_Institution :
Government College, Department of Physics, Ajmer, India
Abstract :
A new method is suggested for measurement of lifetime of photoinjected carriers in the base layer of a p-n junction solar cell. The cell is switched from the open-circuit to the shortcircuit mode of operation by using a negative voltage pulse. C.R.O. trace of the output voltage pulse provides a direct means for lifetime measurement.
Keywords :
carrier lifetime; minority carriers; solar cells; lifetime measurement method; lifetime of photoinjected carriers; minority carriers; open circuit to short circuit switching; p-n junction solar cell;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790328
