DocumentCode :
952232
Title :
Adaptive cancellation of fixed-pattern noise in c.c.d. serial-parallel-serial memory
Author :
Geddes, R.C. ; Cowan, C.F.N. ; Mavor, J. ; Dickson, J.F.
Author_Institution :
University of Edinburgh, School of Engineering Science, Edinburgh, UK
Volume :
15
Issue :
16
fYear :
1979
Firstpage :
505
Lastpage :
507
Abstract :
The letter addresses the problem of the effective implementation of long analogue delay lines. Charge-coupled devices (c.c.d.) appear attractive for this application but suffer from the problem of signal smearing due to imperfect charge transfer. Although s.p.s. delay-line configurations minimise charge-transfer inefficiency, they emphasise the significance of dark current which can cause severe fixed-pattern noise problems in this architecture. A scheme is proposed here for the cancellation of fixed-pattern noise in s.p.s. delay lines and results are presented to demonstrate the effectiveness of the system.
Keywords :
charge-coupled device circuits; delay lines; CCD; adaptive cancellation of fixed pattern noise; charge transfer inefficiency; dark current; imperfect charge transfer; long analogue delay lines; serial parallel serial memory; signal smearing;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19790365
Filename :
4243481
Link To Document :
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