• DocumentCode
    952883
  • Title

    Integrated-circuit fabrication flaw detected using the supply-current analysis technique

  • Author

    Rowlands, M.G.

  • Author_Institution
    Post Office Research Department, Ipswich, UK
  • Volume
    15
  • Issue
    23
  • fYear
    1979
  • Firstpage
    745
  • Lastpage
    747
  • Abstract
    A serious internal fabrication defect detected in a t.t.l. bipolar integrated circuit has been revealed by analysing anomalies in the supply-current dependence upon the logic input. The result strengthens the claim for using this approach as a quality and reliability screening method.
  • Keywords
    integrated circuit testing; integrated logic circuits; production testing; quality control; reliability; transistor-transistor logic; IC fabrication flaw detection; IC testing; production testing; quality control screening TTL; reliability screening method; supply current analysis technique;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19790533
  • Filename
    4243561
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=952883