• DocumentCode
    953119
  • Title

    The Glaze Resistor - It´s Structure and Reliability

  • Author

    Melan, E.H. ; Mones, A.H.

  • Author_Institution
    International Business Machines Corporation, Poughkeepsie, NY
  • Volume
    11
  • Issue
    2
  • fYear
    1964
  • fDate
    6/1/1964 12:00:00 AM
  • Firstpage
    76
  • Lastpage
    85
  • Abstract
    Described herein are certain features of the microstructure of the palladium-silver-glass glaze resistor. Experimental evidence given indicates PdO to be a controlling factor in the conduction process. The effect of process variables on resistivity, TCR, and drift behavior under environmental stress are also discussed
  • Keywords
    Conductivity; Firing; Glass; Glazes; Microstructure; Palladium; Resistors; Silver; Stability; Temperature;
  • fLanguage
    English
  • Journal_Title
    Component Parts, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0097-6601
  • Type

    jour

  • DOI
    10.1109/TCP.1964.1135004
  • Filename
    1135004