• DocumentCode
    953660
  • Title

    Stability of self-consistent Monte Carlo Simulations: effects of the grid size and of the coupling scheme

  • Author

    Palestri, Pierpaolo ; Barin, Nicola ; Esseni, David ; Fiegna, Claudio

  • Author_Institution
    Udine Univ., Italy
  • Volume
    53
  • Issue
    6
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    1433
  • Lastpage
    1442
  • Abstract
    In this paper, the authors show that the grid spacing affects the stability of self-consistent Monte Carlo device simulations. An analytical model is derived to describe this effect. Guidelines for the choice of the grid size are provided, showing that, when the linear Poisson scheme is used, source/drain extensions with doping level as high as 1020 cm-3 require grid spacing lower than 1 nm in order to have stable simulations. On the other hand, the nonlinear coupling scheme does not impose any constraint, provided that the time between two solutions of the Poisson equation is so long that each solution can be considered as a stationary solution of the Boltzmann transport equation.
  • Keywords
    Boltzmann equation; Monte Carlo methods; Poisson equation; semiconductor device models; stability; Boltzmann transport equation; Monte Carlo simulations; grid size; grid spacing; linear Poisson scheme; nonlinear coupling scheme; source/drain extensions; stability analysis; Analytical models; Boltzmann equation; Computational modeling; Couplings; Doping; Guidelines; Monte Carlo methods; Poisson equations; Scattering; Stability; Device simulations; Monte Carlo (MC) methods; stability analysis;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.874758
  • Filename
    1637641