• DocumentCode
    953797
  • Title

    Erratum: Measurement arrangement for direct capacitance/surface-potential recording on m.o.s. capacitor

  • Author

    Ligtenberg, H.C.G. ; Snijder, J.

  • Volume
    16
  • Issue
    1
  • fYear
    1980
  • Firstpage
    45
  • Keywords
    capacitance measurement; metal-insulator-semiconductor structures; MOS capacitor; direct capacitance/surface potential recording; measurement arrangement; slow ramp C/V method;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19800035
  • Filename
    4243819
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=953797