DocumentCode :
954094
Title :
Intermetallic Growth and Contact Resistance of Tin Contacts After Aging
Author :
Lindborg, Ulf ; Asthner, Bengt ; Lind, Lena ; Révay, László B.
Author_Institution :
L M Ericsson Telephone Company,Sweden
Volume :
12
Issue :
1
fYear :
1976
fDate :
3/1/1976 12:00:00 AM
Firstpage :
33
Lastpage :
39
Abstract :
The microstructure and the X-ray diffraction properties were studied for tin electroplates deposited from bright acid baths as well as from a stannate bath. Aging at 50°C for 7 years, largely converted 5µm coatings to various intermetallic compounds: Cu6Sn5and Cu3Sn or Ni3Sn4depending on the substrate. Dull tin electroplates showed low contact resistance also after aging in spite of a large proportion intermetallic phase at the surface. Bright tin from acid sulphate baths of three different formulations and in particular a tin-nickel alloy coating showed high contact resistances after aging. It seems very doubtful that bright tin could replace gold. Dull tin or tin-lead may offer better chances.
Keywords :
Contacts; Resistance; Tin; Aging; Circuits; Coatings; Contact resistance; Copper alloys; Electrical resistance measurement; Intermetallic; Seminars; Surface resistance; Tin;
fLanguage :
English
Journal_Title :
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
0361-1000
Type :
jour
DOI :
10.1109/TPHP.1976.1135097
Filename :
1135097
Link To Document :
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