• DocumentCode
    954618
  • Title

    Prevention of Bridging Failure in Mercury Switches

  • Author

    Bennett, James E. ; Van Der Wielen, Michael P. ; Asbell, Walter E. ; Pinnel, M. Robert

  • Author_Institution
    Bell Laboratories,Columbus, OH
  • Volume
    12
  • Issue
    4
  • fYear
    1976
  • fDate
    12/1/1976 12:00:00 AM
  • Firstpage
    380
  • Lastpage
    387
  • Abstract
    Service failures of sealed mercury switches in relays may occur by "sticking" or by "bridging," Analyses by scanning-electron-microscope microprobe and by X-ray diffraction revealed that bridging failures in certain make,before-break-type switches can be due to the accumulation of particles of NiHg4in the mercury which, because of increased viscosity, may form a quasi-steady bridge between the movable and fixed contacts. Doping of the mercury with copper and tin was proposed as a solution to the bridging problem based on the analysis of failed switches and the knowledge gained from previous studies of liquid-mercury/solid-metal interactions [1]. The results of an accelerated laboratory test and a field trial comparing the electrical characteristics of undoped and doped switches confirm that the failure mechanism is thermally activated. The undoped switches were prone to bridging failure. Prevention of bridging failure in doped switches is attributed to the preferential formation Of a tin-bearing layer which inhibits the dissolution of nickel and the subsequent formation of a viscous slurry of NiHg4in mercury.
  • Keywords
    Component reliability; Mercury devices; Switches; Bridges; Copper; Doping; Failure analysis; Life estimation; Relays; Switches; Tin; Viscosity; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Parts, Hybrids, and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0361-1000
  • Type

    jour

  • DOI
    10.1109/TPHP.1976.1135148
  • Filename
    1135148