DocumentCode
954732
Title
The Case for Multichip LSI Packaging of High-Reliability Military Electronics
Author
Farrand, W.A.
Author_Institution
Rockwell International,Anaheim, CA
Volume
12
Issue
4
fYear
1976
fDate
12/1/1976 12:00:00 AM
Firstpage
288
Lastpage
292
Abstract
Only by a judicious combination of compatible materials, technology, and "production state of the art" can ruggedness, reliability, versatility, and utilization be realized. This choice can only be achieved through high-quality system · engineering which covers the architecture, detail engineering, manufacturing, inspection, and maintenance of the product throughout its entire service life. The thesis is that the electrical, electronic, thermal, mechanical, construction, test, and rework characteristics must be given proper weight at all points in the design. This paper presents an argument for uncased packages of multichip large-scale integrated (LSI) devices as the best solution for the high-reliability system applications presented here.
Keywords
Integrated circuit packaging; Electronic packaging thermal management; Electronics packaging; Inspection; Large scale integration; Maintenance; Manufacturing; Materials reliability; Production; Reliability engineering; Systems engineering and theory;
fLanguage
English
Journal_Title
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0361-1000
Type
jour
DOI
10.1109/TPHP.1976.1135159
Filename
1135159
Link To Document