• DocumentCode
    954732
  • Title

    The Case for Multichip LSI Packaging of High-Reliability Military Electronics

  • Author

    Farrand, W.A.

  • Author_Institution
    Rockwell International,Anaheim, CA
  • Volume
    12
  • Issue
    4
  • fYear
    1976
  • fDate
    12/1/1976 12:00:00 AM
  • Firstpage
    288
  • Lastpage
    292
  • Abstract
    Only by a judicious combination of compatible materials, technology, and "production state of the art" can ruggedness, reliability, versatility, and utilization be realized. This choice can only be achieved through high-quality system · engineering which covers the architecture, detail engineering, manufacturing, inspection, and maintenance of the product throughout its entire service life. The thesis is that the electrical, electronic, thermal, mechanical, construction, test, and rework characteristics must be given proper weight at all points in the design. This paper presents an argument for uncased packages of multichip large-scale integrated (LSI) devices as the best solution for the high-reliability system applications presented here.
  • Keywords
    Integrated circuit packaging; Electronic packaging thermal management; Electronics packaging; Inspection; Large scale integration; Maintenance; Manufacturing; Materials reliability; Production; Reliability engineering; Systems engineering and theory;
  • fLanguage
    English
  • Journal_Title
    Parts, Hybrids, and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0361-1000
  • Type

    jour

  • DOI
    10.1109/TPHP.1976.1135159
  • Filename
    1135159