• DocumentCode
    954806
  • Title

    Characteristics of in-line Josephson tunneling gates

  • Author

    Basavaiah, S. ; Broom, R.F.

  • Author_Institution
    IBM Thomas J. Watson Research Center, Yorktown Heights, New York
  • Volume
    11
  • Issue
    2
  • fYear
    1975
  • fDate
    3/1/1975 12:00:00 AM
  • Firstpage
    759
  • Lastpage
    762
  • Abstract
    Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good.
  • Keywords
    Josephson device logic gates; Current density; Equations; Helium; Josephson effect; Josephson junctions; Magnetic fields; Superconducting films; Superconducting logic circuits; Tunneling; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1975.1058677
  • Filename
    1058677
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=954806