DocumentCode :
955726
Title :
Mechanism and Control of Post-Trim Drift of Laser-Trimmed Thick-Film Resistors
Author :
Shah, Jayant S. ; Berrin, Lloyd
Author_Institution :
Bell labs,Allentown, PA
Volume :
1
Issue :
2
fYear :
1978
fDate :
6/1/1978 12:00:00 AM
Firstpage :
130
Lastpage :
136
Abstract :
Some of the important parameters controlling the postlaser trim drift of 100, l-K, 10-K, and 100-K \\Omega //Box$^b thick-film resistors are reported. The fired thickness of the resistor plays a major role in the control of post-trim drift. The resistors with fired thickness (tf) \\leq 0.5 mil show small ( \\Delta R/R \\leq 0.3 percent) and predictable drift, whereas those with tf> 0.5 mil produce large ( \\Delta R/R \\geq 0.3 percent) and unpredictable drift. A mechanism for the post-trim drift is proposed. Results indicate that the percent trimming for precision resistors should be held within 25 to 30 percent range for minimum drift. The trim geometry such as L-cuts or two P-cuts from the same side of the resistor produces the least amount of drift. The protective overglaze coating on the resistors has a beneficial effect of reducing the drift, especially for the resistors with tf> 0.5 mil. The resistor size (L X W) does not significantly influence the drift as long as the tf< 0.5 mil.
Keywords :
Laser applications, materials processing; Thick-film resistors; Coatings; Ink; Laser beam cutting; Laser beams; Laser stability; Manufacturing; Optical control; Protection; Resistors; Thickness control;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1978.1135262
Filename :
1135262
Link To Document :
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