Title :
Ultra-High Density VLSI Modules
Author :
Ciccio, Joseph A. ; Thun, Rudolf E.
Author_Institution :
Raytheon Company,Bedford, MA
fDate :
9/1/1978 12:00:00 AM
Abstract :
A novel packaging approach is described for low-power digital VLSI (very large-scale integration) technologies, which provides low-capacity interconnections throughout and eliminates higher packaging levels. The approach is based on the use of hybrid circuits utilizing high-density interconnections on sapphire substractes with a Fotoceram (trademark-Corning Glass Company) backing. These sapphire/Fotoceram wafers are assembled in a single stack, and wafer-to-wafer interconnections are provided by a ring of elastomeric contacts. This assembly is mounted in a sealed container utilizing ebullient cooling. This design provides very high packaging densities, minimizes circuit delays, and is easily maintainable.
Keywords :
Digital integrated circuits; Hybrid integrated circuit packaging; Hybrid integrated-circuit interconnections; Integrated digital circuits; Assembly; Delay; Impedance; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Large scale integration; Logic circuits; MOS devices; Very large scale integration;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1978.1135276