• DocumentCode
    955977
  • Title

    Foreword

  • Author

    Porter, W.

  • Author_Institution
    A&M university, Texas
  • Volume
    1
  • Issue
    3
  • fYear
    1978
  • fDate
    9/1/1978 12:00:00 AM
  • Firstpage
    202
  • Lastpage
    202
  • Keywords
    Electrical engineering; Instruments; Manufacturing; Nondestructive testing; Physics; Research and development; Solid state circuits; Very large scale integration; Wire;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1978.1135289
  • Filename
    1135289