DocumentCode
956116
Title
Improved optical interference technique for the measurements of refractive index and thickness of submicron bubble films
Author
Nakagawa, T. ; Kono, N. ; Asama, K.
Author_Institution
Fujitsu Laboratories Ltd., Kawasaki, Japan
Volume
11
Issue
5
fYear
1975
fDate
9/1/1975 12:00:00 AM
Firstpage
1397
Lastpage
1399
Abstract
A method of measuring the refractive index and thickness of garnet films by the combined use of the variable wavelength method and the variable angle monochromatic fringe observation method has been developed. This technique can be used to determine film thicknesses from 0.5 μm to several microns with an accuracy of 1%. A rapid and accurate evaluation technique for the measurement of the bubble collapse field is described. Stable submicron bubbles can be found in the Systems, (YCaSm)3 - (GeFe)5 O12 , (YCaEuTm)3 (GeFe)5 O12 and (YLaTm)3 (GaFe)5 O12 . Bubble velocities for these films were measured by the bubble transport method. At a driving field of 2.5 Oe across the bubble, velocities ranging from 300 te 1050 Cm/sec have been observed.
Keywords
Magnetic bubble domains; Magnetic bubble films; Optical measurements; Optical refraction; Thickness measurement; Garnet films; Interference; Optical films; Optical refraction; Optical variables control; Refractive index; Tellurium; Thickness measurement; Velocity measurement; Wavelength measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1975.1058811
Filename
1058811
Link To Document