• DocumentCode
    956116
  • Title

    Improved optical interference technique for the measurements of refractive index and thickness of submicron bubble films

  • Author

    Nakagawa, T. ; Kono, N. ; Asama, K.

  • Author_Institution
    Fujitsu Laboratories Ltd., Kawasaki, Japan
  • Volume
    11
  • Issue
    5
  • fYear
    1975
  • fDate
    9/1/1975 12:00:00 AM
  • Firstpage
    1397
  • Lastpage
    1399
  • Abstract
    A method of measuring the refractive index and thickness of garnet films by the combined use of the variable wavelength method and the variable angle monochromatic fringe observation method has been developed. This technique can be used to determine film thicknesses from 0.5 μm to several microns with an accuracy of 1%. A rapid and accurate evaluation technique for the measurement of the bubble collapse field is described. Stable submicron bubbles can be found in the Systems, (YCaSm)3- (GeFe)5O12, (YCaEuTm)3(GeFe)5O12and (YLaTm)3(GaFe)5O12. Bubble velocities for these films were measured by the bubble transport method. At a driving field of 2.5 Oe across the bubble, velocities ranging from 300 te 1050 Cm/sec have been observed.
  • Keywords
    Magnetic bubble domains; Magnetic bubble films; Optical measurements; Optical refraction; Thickness measurement; Garnet films; Interference; Optical films; Optical refraction; Optical variables control; Refractive index; Tellurium; Thickness measurement; Velocity measurement; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1975.1058811
  • Filename
    1058811