• DocumentCode
    956495
  • Title

    Long-term performance of precision crystal oscillators in a near-Earth orbital environment

  • Author

    Rueger, Lauren J. ; Norton, Jerry R. ; Lasewicz, Paul T.

  • Author_Institution
    Bendix Field Eng. Corp., Columbia, MD, USA
  • Volume
    40
  • Issue
    5
  • fYear
    1993
  • Firstpage
    528
  • Lastpage
    531
  • Abstract
    The Navy Navigation Satellite System (NNSS) uses precision quartz crystal oscillators to provide time and frequency in the orbiting spacecraft. The frequency changes for multiple oscillators, which were observed for 28 years of operational service in the orbital environment, are discussed. The primary frequency changes are believed to be caused by mass transfer to and from the resonator, stress relief in the resonator mounting structure and electrodes, and ionizing radiation of the quartz resonator. Observations to a resolution of 10- 13 have been made from 1963 to 1991 on 20 operational satellites in near-Earth orbit. No oscillator failures have occurred during the entire program life of nearly 30 years. One oscillator provided continuous operational service for over 21 years, and several have served more than 15 years. No oscillator changed frequency more than two parts in 107 while in operational service. One of the best performing oscillators had a predictable drift rate of 9*10/sup -13/+or-1*10/sup -13/ per day after three years of service.<>
  • Keywords
    artificial satellites; crystal resonators; radiofrequency oscillators; Navy Navigation Satellite System; low-term performance; near-Earth orbital environment; operational satellites; orbiting spacecraft; precision crystal oscillators; quartz crystal; quartz resonator; Doppler shift; Earth; Extraterrestrial measurements; Ionizing radiation; Marine vehicles; Oscillators; Power systems; Radio frequency; Satellite navigation systems; Space vehicles;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.238105
  • Filename
    238105