• DocumentCode
    956540
  • Title

    Measurement of Internal Stresses in Encapsulated Electronic Modules

  • Author

    Stucki, F.F. ; Fuller, W.D. ; Carpenter, R.D.

  • Author_Institution
    Lockheed Missiles & Space Co.
  • Volume
    1
  • Issue
    1
  • fYear
    1965
  • fDate
    6/1/1965 12:00:00 AM
  • Firstpage
    178
  • Lastpage
    185
  • Abstract
    The development of a hydrostatically-pressure sensitive transducer with dimensions much smaller than conventional pigtailed electronic components has made possible the measurement of environmentally-induced stresses in encapsulated electronic modules. Such measurements for a few encapsulants have shown large changes in internal stresses with small changes in ambient temperature, a shift in the stress transition range with formulation variations and changes in stress magnitude with component density in an electronic module.
  • Keywords
    Encapsulation-stresses; Microminiature; Pressure sensors; Encapsulation; Frequency; Human factors; Internal stresses; Plastics; Pressure measurement; Stress measurement; Temperature distribution; Transducers; Transformer cores;
  • fLanguage
    English
  • Journal_Title
    Parts, Materials and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9502
  • Type

    jour

  • DOI
    10.1109/TPMP.1965.1135348
  • Filename
    1135348