DocumentCode
956540
Title
Measurement of Internal Stresses in Encapsulated Electronic Modules
Author
Stucki, F.F. ; Fuller, W.D. ; Carpenter, R.D.
Author_Institution
Lockheed Missiles & Space Co.
Volume
1
Issue
1
fYear
1965
fDate
6/1/1965 12:00:00 AM
Firstpage
178
Lastpage
185
Abstract
The development of a hydrostatically-pressure sensitive transducer with dimensions much smaller than conventional pigtailed electronic components has made possible the measurement of environmentally-induced stresses in encapsulated electronic modules. Such measurements for a few encapsulants have shown large changes in internal stresses with small changes in ambient temperature, a shift in the stress transition range with formulation variations and changes in stress magnitude with component density in an electronic module.
Keywords
Encapsulation-stresses; Microminiature; Pressure sensors; Encapsulation; Frequency; Human factors; Internal stresses; Plastics; Pressure measurement; Stress measurement; Temperature distribution; Transducers; Transformer cores;
fLanguage
English
Journal_Title
Parts, Materials and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0018-9502
Type
jour
DOI
10.1109/TPMP.1965.1135348
Filename
1135348
Link To Document