Title :
Printed Circuit Connectors from Microassemblies
Author :
Schumacher, J.H. ; Lane, W.V.
Author_Institution :
Cinch Manufacturing Co.
fDate :
6/1/1965 12:00:00 AM
Keywords :
Connectors; Microelectronics; Test socket; Thin films; Atmosphere; Circuit testing; Connectors; Contact resistance; Glass; Insulation; Microassembly; Pins; Printed circuits; Protection;
Journal_Title :
Parts, Materials and Packaging, IEEE Transactions on
DOI :
10.1109/TPMP.1965.1135352