Title :
Surface defect studies of flexible media using magnetoresistive sensors
Author :
Talke, F.E. ; Tseng, R.C. ; Nelson, G.N.
Author_Institution :
IBM Research Laboratory, San Jose, CA, USA
fDate :
9/1/1975 12:00:00 AM
Abstract :
The thermal spike frequency of magnetoresistive sensors is investigated as a function of average head/tape flying height. A qualitative relationship between particular thermal spikes and surface defects is shown to exist and insight is gained into the nature of "flying" at submicron spacings. Results for clear and oxide coated surfaces of varying surface topography are discussed.
Keywords :
Magnetic recording/reading heads; Magnetoresistive transducers; Frequency; Interference; Magnetic heads; Magnetic sensors; Magnetoresistance; Noise shaping; Optical interferometry; Optical microscopy; Surface topography; Thermal sensors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1975.1058889