Title :
Temperature Coefficients of Resistance: A New Approach
Author_Institution :
Newmarket Transistors Ltd.,OAU
fDate :
6/1/1979 12:00:00 AM
Abstract :
An empirical relationship is developed for the temperature variation of thick-film resistors. From this two coefficients are derived which can be used to predict resistance and tracking variations at any temperature. The predicted results are compared to actual mea- surements.
Keywords :
Thick-film circuit thermal factors; Thick-film resistors; Circuit optimization; Curve fitting; Electrical resistance measurement; Equations; Error correction; Ink; Laser stability; Mathematical model; Resistors; Temperature distribution;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1979.1135452
