DocumentCode :
957942
Title :
Extension of High-Temperature Electronics
Author :
Draper, Bruce L. ; Palmer, David W.
Author_Institution :
Sandia Laboratories,NM
Volume :
2
Issue :
4
fYear :
1979
fDate :
12/1/1979 12:00:00 AM
Firstpage :
399
Lastpage :
404
Abstract :
Commercial and Sandia fabricated silicon MOSFET´s, thickfill resistors and capacitors, and magnetic components were investigated in an effort to increase the versatility of microelectronics used at 300°C and to form a foundation for a higher temperature technology. Commerical MOSFET´s were found susceptible to parameter drifts and have unacceptable electrical characteristics when tested at 300°C, whereas redesigned low alkali impurity devices were able to maintain stable operation at 300°C for 1000 h with improved characteristics. Thus, although MOSFET´s are prone to aging, it is possible to use fabrication procedures which allow MOSFET use at high temperature. A specially developed ceramic filled, high silica frit dielectric thick-film material exhibited a sufficiently high resistivity to permit development of 300°C, 1.0 muF capacitors. Procedures were developed to make this material compatible with the multilayer brick capacitor format which is necessary for miniaturization. Both this dielectric and a ruthenium-based resistor material were shown useful to 500°C. In addition, a spectrum of magnetic components was qualified for use at 500°C.
Keywords :
MOSFETs; Magnetic thermal factors; Semiconductor device thermal factors; Thick-film capacitors; Thick-film circuit thermal factors; Thick-film resistors; Capacitors; Dielectric materials; Electric variables; Impurities; Magnetic materials; Microelectronics; Resistors; Silicon; Temperature; Testing;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1979.1135491
Filename :
1135491
Link To Document :
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