Title :
Bounds on the Length of Terminal Stuck-Fault Test
Author_Institution :
Department of Electrical Engineering, Johns Hopkins University, Baltimore, Md. 21218.
fDate :
3/1/1972 12:00:00 AM
Abstract :
A terminal stuck fault in a logic network is represented by one or more stuck-at-1 or stuck-at-0 faults on the n input lines or single output. It is shown that for n ¿ 5, a least upper bound on the test length is n + 1, and for n ≫ 5, an upper bound is 2n - 4. A greatest lower bound is 3, for all n ≫ 1. The upper bounds are based on a maximum size alternating 1-tree in the n-cube representation of the function. Of the more than 600 000 equivalence classes of functions of n variables, n ¿ 5, only one does not have an n-edge alternating 1-tree. An algorithm is proposed for constructing tests based on alternating 1-trees.
Keywords :
Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Switching circuits; Tree graphs; Upper bound; Bounds; fault detection; graphs; multiple faults; terminal stuck faults; test length; trees;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1972.5008955