DocumentCode
959010
Title
On the Extraction of Pattern Features from Imperfectly Identified Samples
Author
Babu, C.Chitti
Author_Institution
Department of Electrical Engineering, University of Waterloo, Waterloo, Ont., Canada.
Issue
4
fYear
1972
fDate
4/1/1972 12:00:00 AM
Firstpage
410
Lastpage
411
Abstract
The application of Bhattacharyya coefficient for the selection of effective features from imperfectly labeled patterns is examined.
Keywords
Circuits and systems; Electrons; Feature extraction; Information theory; Network address translation; Probability density function; Probability distribution; Statistical analysis; Statistical distributions; Upper bound; Bhattacharyya coefficient; feature selection; imperfectly identified patterns; pattern recognition; probability of error;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1972.5008992
Filename
5008992
Link To Document