Title :
An Automatic Test Generation System for Illiac IV Logic Boards
Author :
Agrawal, Vishwani D. ; Agrawal, Prathima
Author_Institution :
Automation Technology, Inc., Champaign, Ill.; EG&G, Inc., Albuquerque, N. Mex. 87106.
Abstract :
A test generation system, developed for the logic boards of the Illiac IV computer, is described. The system combines the test generation by random patterns and the D-algorithm. Some results are given to illustrate the effectiveness of this approach.
Keywords :
Automatic logic units; Automatic testing; Circuit faults; Circuit testing; Fault detection; Flowcharts; Logic testing; Random number generation; System testing; Test pattern generators; D-algorithm; fault diagnosis; off-line computer diagnosis; random test generation; test generation;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1972.5009081
