Title :
Introduction to the Special Issue on the 2007 International Integrated Reliability Workshop
Author :
Lenahan, Patrick M. ; Knowlton, Bill ; Conley, John F. ; Tonti, Bill ; Suehle, John ; Grasser, Tibor
Abstract :
The six papers in this special section were selected from the presentations at the 2007 IEEE International Integrated Reliability Workshop (IIRW), held near South Lake Tahoe, California, on October 15-18, 2007.
Keywords :
CMOS technology; Charge pumps; Conferences; Fuses; Lakes; Measurement techniques; Niobium compounds; Semiconductor device reliability; Special issues and sections; Titanium compounds;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2008.2006011
