• DocumentCode
    959797
  • Title

    Magnetic bubble dual-in-line package (DIP) functional and reliability testing

  • Author

    Kowalchuk, R. ; Bobeck, A.H. ; Butherus, A.D. ; Ciak, F.J. ; Smith, D.H.

  • Author_Institution
    Bell Laboratories, Murray Hill, New Jersey
  • Volume
    12
  • Issue
    6
  • fYear
    1976
  • fDate
    11/1/1976 12:00:00 AM
  • Firstpage
    691
  • Lastpage
    693
  • Abstract
    Computer tested magnetic bubble chips have been assembled into dual-in-line packages (DIPs). In order to insure that stringent telephone station apparatus specifications are met, many packages have been subjected to extensive functional and environmental tests. From the functional tests average values and standard deviations of operating parameters at minimum rotating field over the temperature range of -25°C to +50°C have been determined. Environmental tests included temperature cycling (-40°C to +65°C), thermal shock, high temperature at high humidity (85% humidity/85°C), and mechanical shock and vibration. Of the 74 packages subjected to all environmental tests, 48 (or 64.9%) passed. Data indicate the package design to be good in terms of meeting operational, shock and vibration requirements; however, improvements in bond reliability are indicated.
  • Keywords
    Component reliability; Magnetic bubble memories; Assembly; Chip scale packaging; Detectors; Electric shock; Electronics packaging; Humidity; Magnetic shielding; Telephony; Temperature distribution; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1976.1059192
  • Filename
    1059192