DocumentCode
959797
Title
Magnetic bubble dual-in-line package (DIP) functional and reliability testing
Author
Kowalchuk, R. ; Bobeck, A.H. ; Butherus, A.D. ; Ciak, F.J. ; Smith, D.H.
Author_Institution
Bell Laboratories, Murray Hill, New Jersey
Volume
12
Issue
6
fYear
1976
fDate
11/1/1976 12:00:00 AM
Firstpage
691
Lastpage
693
Abstract
Computer tested magnetic bubble chips have been assembled into dual-in-line packages (DIPs). In order to insure that stringent telephone station apparatus specifications are met, many packages have been subjected to extensive functional and environmental tests. From the functional tests average values and standard deviations of operating parameters at minimum rotating field over the temperature range of -25°C to +50°C have been determined. Environmental tests included temperature cycling (-40°C to +65°C), thermal shock, high temperature at high humidity (85% humidity/85°C), and mechanical shock and vibration. Of the 74 packages subjected to all environmental tests, 48 (or 64.9%) passed. Data indicate the package design to be good in terms of meeting operational, shock and vibration requirements; however, improvements in bond reliability are indicated.
Keywords
Component reliability; Magnetic bubble memories; Assembly; Chip scale packaging; Detectors; Electric shock; Electronics packaging; Humidity; Magnetic shielding; Telephony; Temperature distribution; Testing;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1976.1059192
Filename
1059192
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