Electrical characterization of a packaged 100 kBit major/minor loop bubble device

A 100K bit, five micron, major/minor loop device was characterized for operation from 0 to +70°C in order to specify the tolerances on the interface circuitry. The device was operated in a magnetically self-contained module with a temperature-compensated bias field. A description is given of the computerized test apparatus, its high-level bubble test language, and the process parameters of the bubble device. The nominal operating parameters are given, with timing phases referenced to the triangular drive current waveforms. Operation was characterized with respect to variation of all parameters and permissible limits on these parameters are given for 0 to +70°C operation. Longevity data are given for major loop and minor loop propagation under stop/start and continuous conditions.