• DocumentCode
    961089
  • Title

    Simultaneous determination of device noise and gain parameters through noise measurements only

  • Author

    Sannino, Mario

  • Author_Institution
    University di Palermo, Palermo, Italy
  • Volume
    68
  • Issue
    10
  • fYear
    1980
  • Firstpage
    1343
  • Lastpage
    1345
  • Abstract
    A novel method of measuring the noise and gain parameters of a linear two-port is presented. This method is based on the Friis formula to determine all the noise and gain parameters solely from noise figure measurements. This results in a much simplified procedure and improved accuracy over the conventional methods. An example using a low-noise transistor at 2 GHz is shown.
  • Keywords
    Admittance; Delay; Digital filters; Finite impulse response filter; Gain measurement; Lattices; Noise figure; Noise measurement; System testing; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1980.11859
  • Filename
    1456128
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=961089