• DocumentCode
    961471
  • Title

    Structured puncturing for rate-compatible B-LDPC codes with dual-diagonal parity structure

  • Author

    Park, Hyo Yol ; Kim, Kwang Soon ; Kim, Dong Ho ; Whang, Keum Chan

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul
  • Volume
    7
  • Issue
    10
  • fYear
    2008
  • fDate
    10/1/2008 12:00:00 AM
  • Firstpage
    3692
  • Lastpage
    3696
  • Abstract
    In this paper, we propose a generalized formula for generating puncturing patterns for block-type low-density parity check (B-LDPC) codes with dual-diagonal parity structure. The proposed formula distributes punctured bits uniformly in the zigzag edge connections, as well as maximizes the minimum recovery speed and the reliability of each punctured node. Also, the proposed puncturing can be applied to any B-LDPC code with dual-diagonal parity structure and can provide efficient bitwise puncturing patterns even when the number of puncturing bits is not equal to an integer multiple of the block size. Simulation results show that the proposed punctured B-LDPC codes are better than existing punctured B-LDPC codes and even dedicated B-LDPC codes used in commercial standards.
  • Keywords
    parity check codes; telecommunication network reliability; dual-diagonal parity structure; rate-compatible B-LDPC codes; structured puncturing; zigzag edge connections; Automatic repeat request; Code standards; Decoding; Forward error correction; Parity check codes; Redundancy; Solids; Sparse matrices; Transmitters; Turbo codes; Block-type LDPC code, rate-compatible code, hybrid ARQ;
  • fLanguage
    English
  • Journal_Title
    Wireless Communications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-1276
  • Type

    jour

  • DOI
    10.1109/T-WC.2008.070409
  • Filename
    4657312