• DocumentCode
    962020
  • Title

    High-speed response of InAlAs/InGaAs M-S-M photodetectors at 1.3- and 1.5- mu m wavelengths: experiment and theory

  • Author

    Soole, J.B.D. ; Schumacher, Hermann ; Leblanc, Herve P. ; Bhat, Ritesh ; Koza, M.A.

  • Author_Institution
    Bellcore, Red Bank, NJ, USA
  • Volume
    36
  • Issue
    11
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    2624
  • Lastpage
    2625
  • Abstract
    Summary form only given. The authors report the DC and pulse response, at 1.3- and 1.5- mu m wavelengths, of OMCVD-grown In0.53Ga0.47As/InP metal-semiconductor-metal (M-S-M) photodetectors which use a thin layer of lattice-matched In0.52Al0.48As for barrier enhancement. They also report the results of a computational study of the temporal response of the generic InGaAs M-S-M detector at these wavelengths, indicating how the device dimensions influence the bandwidth. Pulse responses of 55 ps FWHM (full width at half maximum) at 1.53 mu m and 48 ps at 1.31 mu m were obtained with gain switched diode laser pulses, indicating intrinsic bandwidths of approximately 8 and approximately 11 GHz, respectively, with a limiting system response width of approximately 40 ps. The authors present the results of 2D calculations of the transit time limited impulse response of the detector for 1.3- and 1.4- mu m incident radiation.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; infrared detectors; metal-semiconductor-metal structures; photodiodes; transient response; 1.3 micron; 1.5 micron; 11 GHz; 40 ps; 48 ps; 55 ps; 8 GHz; DC response; In0.53Ga0.47As-InP; InAlAs-InGaAs; InP; MSM photodetectors; OMCVD; bandwidth; barrier enhancement; gain switched diode laser pulses; pulse response; temporal response; transit time limited impulse response; Bandwidth; Detectors; Diode lasers; Indium compounds; Indium gallium arsenide; Indium phosphide; Optical pulses; Photodetectors; Space vector pulse width modulation; Time factors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43749
  • Filename
    43749