• DocumentCode
    962649
  • Title

    Application of the Finite Element Method to Determine the Electrical Resistance, Inductance, Capacitance parameters for the Circuit Package Enviornment

  • Author

    Olson, Leonard T.

  • Author_Institution
    IBM Corp, Endicott, NY, USA
  • Volume
    5
  • Issue
    4
  • fYear
    1982
  • fDate
    12/1/1982 12:00:00 AM
  • Firstpage
    486
  • Lastpage
    492
  • Abstract
    A finite-element program, Fierce, is used to obtain representative R, L, C electrical parameters for various two-dimensional conductor/dielectric packaging structures. The calculated results of Fierce are compared with an existing program C2D and correlated to hardware measurements. Specific advantages of Fierce are cited for ,modeling complex multilevel wiring packages with mixed dielectrics and several grounds. The concluding example demonstrates the capability of Fierce to characterize nine conductor--five dielectric model(s). The R, L, C outputs are inputed to a circuit analysis program, Astap, to compare the performance advantage of a ground plane located close to the conductors versus a far ground plane for a high performance application (800 ps driver switching speeds).
  • Keywords
    Capacitance calculations; FEM; Finite-element method (FEM); Hybrid integrated circuit packaging; Inductance calculations; Resistance measurements; Capacitance; Circuits; Conductors; Dielectric measurements; Electric resistance; Electrical resistance measurement; Finite element methods; Hardware; Inductance; Packaging;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1982.1135980
  • Filename
    1135980