DocumentCode
962649
Title
Application of the Finite Element Method to Determine the Electrical Resistance, Inductance, Capacitance parameters for the Circuit Package Enviornment
Author
Olson, Leonard T.
Author_Institution
IBM Corp, Endicott, NY, USA
Volume
5
Issue
4
fYear
1982
fDate
12/1/1982 12:00:00 AM
Firstpage
486
Lastpage
492
Abstract
A finite-element program, Fierce, is used to obtain representative R, L, C electrical parameters for various two-dimensional conductor/dielectric packaging structures. The calculated results of Fierce are compared with an existing program C2D and correlated to hardware measurements. Specific advantages of Fierce are cited for ,modeling complex multilevel wiring packages with mixed dielectrics and several grounds. The concluding example demonstrates the capability of Fierce to characterize nine conductor--five dielectric model(s). The R, L, C outputs are inputed to a circuit analysis program, Astap, to compare the performance advantage of a ground plane located close to the conductors versus a far ground plane for a high performance application (800 ps driver switching speeds).
Keywords
Capacitance calculations; FEM; Finite-element method (FEM); Hybrid integrated circuit packaging; Inductance calculations; Resistance measurements; Capacitance; Circuits; Conductors; Dielectric measurements; Electric resistance; Electrical resistance measurement; Finite element methods; Hardware; Inductance; Packaging;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1982.1135980
Filename
1135980
Link To Document