DocumentCode
963053
Title
Can a User Test LSI Microprocessors Effectively?
Author
Luciw, W.
Author_Institution
Sperry Univac,Blue Bell, PA
Volume
5
Issue
1
fYear
1976
fDate
3/1/1976 12:00:00 AM
Firstpage
21
Lastpage
23
Abstract
This paper elucidates user oriented test philosophy for LSI microprocessors. Also, a low-cost incoming inspection tester is described. The significant difference between this and available testers is the use of probabilistic scheme by which the instruction, data, and control signal mixes are generated. This approach reduced significantly tester hardware and supporting software without compromise of overall test performance.
Keywords
Computer testing; Integrated circuit testing; Microprocessors; Circuit testing; Costs; Inspection; Large scale integration; Logic devices; Microprocessors; Read only memory; Signal generators; Software testing; System testing;
fLanguage
English
Journal_Title
Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0046-838X
Type
jour
DOI
10.1109/TMFT.1976.1136017
Filename
1136017
Link To Document