DocumentCode
963085
Title
Guest Editor´s Introduction
Author
Kutcher, G.
Author_Institution
IEEE MFT
Volume
5
Issue
1
fYear
1976
fDate
3/1/1976 12:00:00 AM
Firstpage
1
Lastpage
1
Keywords
Automatic testing; Chapters; Data engineering; Finance; Manufacturing automation; Quality control; Sampling methods; Semiconductor device manufacture; Semiconductor device reliability; Technology forecasting;
fLanguage
English
Journal_Title
Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0046-838X
Type
jour
DOI
10.1109/TMFT.1976.1136019
Filename
1136019
Link To Document