Title :
Evaluation method of device noise figure and gain through noise measurements
Author :
Sawayama, Yoshihiko ; Mishima, Katsuhiko
Author_Institution :
Toshiba Corporation, Kawasaki, Japan
Abstract :
A new method of evaluating the noise figure and available gain of a linear two-port device only from noise measurements is proposed. In this method, there is no need for tuning at the output port of a device under test (DUT) by the use of an excess noise injection through a circulator to the device output port. Hence it gives a much simplified procedure and an improvement of accuracy.
Keywords :
Admittance; Attenuators; Circuit noise; Equivalent circuits; Gain measurement; Insertion loss; Noise figure; Noise measurement; Signal to noise ratio; System testing;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1981.12205