Title :
Simple method of m.o.s.-transistor threshold-voltage measurement
Author :
Marciniak, W. ; Rusek, Michal
Author_Institution :
Polish Academy of Science, Warsaw, Poland
Abstract :
A method of m.o.s.-transistor threshold-voltage measurement is described. The method is based on the measurement of the time interval between the pulse that releases the linear voltage ramp applied to the transistor gate, and the pulse of the transient current resulting from the channel formation. This method is particularly useful for investigation of threshold-voltage instabilities.
Keywords :
field effect transistors; voltage measurement; MOST; field effect transistor; threshold voltage; voltage measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19740153
