• DocumentCode
    965089
  • Title

    Evaluation of Mechanical Properties of Thin Wires for Electrical Interconnections

  • Author

    Hannula, Simo-Pekka ; Wanagel, John ; Li, Che-Yu

  • Author_Institution
    Cornell University, Ithaca, NY, USA
  • Volume
    6
  • Issue
    4
  • fYear
    1983
  • fDate
    12/1/1983 12:00:00 AM
  • Firstpage
    494
  • Lastpage
    502
  • Abstract
    A miniaturized universal testing machine was used to measure the yield stress, elastic and anelastic modulus, load relaxation, and low cycle fatigue properties of bonding wires. These material properties were found to be sensitive to the mierostructure of the material produced by a variety of thermal and mechanical treatments. The relations established between structure and properties can potentially be used as a basis for optimizing the bonding wire perform- ance.
  • Keywords
    Bonding; Copper materials/devices; Gold materials/devices; Mechanical factors; Annealing; Bonding; Fatigue; Gold; Mechanical factors; Mechanical variables measurement; Surface resistance; System testing; Thermal stresses; Wires;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1983.1136219
  • Filename
    1136219