DocumentCode
965089
Title
Evaluation of Mechanical Properties of Thin Wires for Electrical Interconnections
Author
Hannula, Simo-Pekka ; Wanagel, John ; Li, Che-Yu
Author_Institution
Cornell University, Ithaca, NY, USA
Volume
6
Issue
4
fYear
1983
fDate
12/1/1983 12:00:00 AM
Firstpage
494
Lastpage
502
Abstract
A miniaturized universal testing machine was used to measure the yield stress, elastic and anelastic modulus, load relaxation, and low cycle fatigue properties of bonding wires. These material properties were found to be sensitive to the mierostructure of the material produced by a variety of thermal and mechanical treatments. The relations established between structure and properties can potentially be used as a basis for optimizing the bonding wire perform- ance.
Keywords
Bonding; Copper materials/devices; Gold materials/devices; Mechanical factors; Annealing; Bonding; Fatigue; Gold; Mechanical factors; Mechanical variables measurement; Surface resistance; System testing; Thermal stresses; Wires;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1983.1136219
Filename
1136219
Link To Document