DocumentCode
965255
Title
Selecting Test Patterns for 4K RAMS
Author
Sohl, Wayne E.
Author_Institution
Macrodata Corp.,Woodland Hills, CA
Volume
6
Issue
3
fYear
1977
fDate
9/1/1977 12:00:00 AM
Firstpage
51
Lastpage
60
Abstract
The selection of 4K RAM test patterns for use in a Go/NoGo or characterization type test program requires consideration of several areas related to test program quality. Among all others, two of the most important of these areas are pattern execution time and failure modes tested for. The most popular test patterns for 4K RAM´S are graphically illustrated with step-by-step instructions on test pattern generation provided.
Keywords
Automatic testing; Computer testing; Production testing; Random-access memories; Circuit faults; Decoding; Electronics industry; Logic devices; Random access memory; Read-write memory; Semiconductor device testing; Test pattern generators; Voltage; Writing;
fLanguage
English
Journal_Title
Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0046-838X
Type
jour
DOI
10.1109/TMFT.1977.1136237
Filename
1136237
Link To Document