• DocumentCode
    966947
  • Title

    Numerical through-resistor (TR) calibration technique for modeling of microwave integrated circuits

  • Author

    Li, Lin ; Wu, Ke

  • Author_Institution
    Dept. of Electr. Eng., Ecole Polytechnique de Montreal, Que., Canada
  • Volume
    14
  • Issue
    4
  • fYear
    2004
  • fDate
    4/1/2004 12:00:00 AM
  • Firstpage
    139
  • Lastpage
    141
  • Abstract
    A through-resistor (TR) calibration procedure is proposed for parameter extraction and accurate modeling of planar discontinuities and circuits by using a full-wave technique such as method of moments (MoM). This new scheme allows the effective use of a commercial electromagnetic field simulator in removing inherent numerical noises or errors in simulation, and making the parameter extraction for circuit models. A microstrip open-end and a microstrip gap are studied and effectiveness of this new scheme is verified.
  • Keywords
    calibration; equivalent circuits; integrated circuit modelling; method of moments; microstrip discontinuities; microwave integrated circuits; parameter estimation; TR calibration; electromagnetic field simulator; full-wave technique; method of moments; microstrip gap; microstrip open-end; microwave integrated circuits modeling; parameter extraction; planar discontinuities modeling; through-resistor; Calibration; Circuit simulation; Electromagnetic fields; Integrated circuit modeling; Integrated circuit noise; Microstrip; Microwave integrated circuits; Microwave theory and techniques; Moment methods; Parameter extraction;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2003.819375
  • Filename
    1291443