Title :
Process Limitations in the Design of Distributed RC Networks
Author :
Feisel, Lyle D. ; Lee, Jau-Yien
Author_Institution :
South Dakota School of Mines and Technology,Rapid City, SD
fDate :
12/1/1971 12:00:00 AM
Abstract :
The design of thin-film distributed RC networks is discussed briefly and a chart is presented that greatly facilitates the initial design procedure. This chart is then used to demonstrate the limitations imposed upon minimum usable frequency by space availability, maximum sheet resistance, and maximum capacitance density.
Keywords :
Capacitance; Circuits; Cutoff frequency; Equations; Fabrication; Filters; Frequency response; Shape; Transistors; Voltage;
Journal_Title :
Parts, Hybrids, and Packaging, IEEE Transactions on
DOI :
10.1109/TPHP.1971.1136428
