DocumentCode
967487
Title
X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors
Author
Wang, Seongmoon ; Balakrishnan, Kedarnath J. ; Wei, Wenlong
Author_Institution
NEC Labs., Princeton, NJ
Volume
57
Issue
7
fYear
2008
fDate
7/1/2008 12:00:00 AM
Firstpage
978
Lastpage
989
Abstract
This paper presents an efficient method to block unknown values for temporal compactors. The control signals for the blocking logic are generated by a linear feedback shift register (LFSR). Control patterns, which describe values required at the control signals of the blocking logic, are compressed by LFSR reseeding. The size of the control LFSR, which is determined by the number of specified bits in the most specified control pattern, is minimized by propagating only one fault effect for each fault and targeting the faults that are uniquely detected by each test pattern. The linear solver to find seeds of the LFSR intelligently chooses a solution such that the impact on test quality is minimal. Very high compression (over 230X) is achieved for benchmark and industrial circuits by the proposed method. Experimental results show that the sizes of control data for the proposed method are smaller than prior work and the runtime of the proposed method is several orders of magnitude smaller than that of prior work. Hardware overhead is very low.
Keywords
data compression; logic gates; shift registers; LFSR reseeding; blocking logic gate; control signal; linear feedback shift register; temporal compactor; Benchmark testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Linear feedback control systems; Linear feedback shift registers; Logic; Signal generators; Size control; BIST; Built-in Self-Test; LFSR reseeding; MISR; blocking unknown values; output compaction; response compaction; temporal compactor; test data compression;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.2007.70833
Filename
4378353
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