DocumentCode
9678
Title
Evaluation of Sub-0.2 V High-Speed Low-Power Circuits Using Hetero-Channel MOSFET and Tunneling FET Devices
Author
Yin-Nien Chen ; Ming-Long Fan ; Hu, Vita Pi-Ho ; Pin Su ; Ching-Te Chuang
Author_Institution
Dept. of Electron. En gineering, Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
61
Issue
12
fYear
2014
fDate
Dec. 2014
Firstpage
3339
Lastpage
3347
Abstract
This paper investigates the feasibility of sub-0.2 V high-speed low-power circuits with hetero-channel MOSFET and emerging Tunneling FET (TFET) devices. First, the device designs and characteristics of hetero-channel MOSFET and TFET devices are discussed and compared. Due to the significant leakage current of ultra-low VT hetero-channel MOSFET devices, assist-circuits are required for hetero-channel MOSFET-based circuits to operate at 0.2 V. Second, the delay, dynamic energy and the Standby power of hetero-channel TFET-based and MOSFET-based logic circuits including Inverter, NAND, BUS Driver, and Latch are analyzed and evaluated. The results indicate that hetero-channel TFET-based circuits with Dual Oxide (DOX) device design to reduce the Miller capacitance provide the potential to achieve high-speed low-power operation at VDD=0.2 V, while the use of assist-circuits in MOSFET-based design improves the delay and dynamic energy at the expense of increased device count, circuit area, and large Standby and sleep-mode leakage power. Finally, the impacts of temperature and process variations on TFET-based and MOSFET-based logic circuits are discussed.
Keywords
MOSFET; leakage currents; low-power electronics; tunnel transistors; DOX device design; Miller capacitance; TFET devices; dual oxide device design; heterochannel MOSFET; high-speed low-power circuits; leakage current; sleep-mode leakage power; standby leakage power; tunneling FET devices; Capacitance; Delays; Inverters; Leakage currents; Logic gates; MOSFET; Tunneling; Hetero-channel MOSFET; high-speed; low-power; tunnel FET;
fLanguage
English
Journal_Title
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher
ieee
ISSN
1549-8328
Type
jour
DOI
10.1109/TCSI.2014.2335032
Filename
6870502
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