• DocumentCode
    968664
  • Title

    DRAM macros for ASIC chips

  • Author

    Sunaga, Toshio ; Miyatake, Hisatada ; Kitamura, Koji ; Kasuya, Keishi ; Saitoh, Takaki ; Tanaka, Masahiro ; Tanigaki, Norio ; Mori, Yohtaro ; Yamasaki, Noritoshi

  • Author_Institution
    Yasu Technol. Application Lab., IBM Japan Ltd., Shigaken, Japan
  • Volume
    30
  • Issue
    9
  • fYear
    1995
  • fDate
    9/1/1995 12:00:00 AM
  • Firstpage
    1006
  • Lastpage
    1014
  • Abstract
    DRAM macros in 4-Mb (0.8-μm) and 16-Mb (0.5-μm) DRAM process technology generations have been developed for CMOS ASIC applications. The macros use the same area efficient one transistor trench cells as 4-Mb (SPT cell) and 16-R Mb (MINT cell) DRAM products. It is shown that the trench cells with capacitor plates by the grounded substrate are ideal structures as embedded DRAM´s. The trench cells built entirely under the silicon surface allow cost effective DRAM and CMOS logic merged process technologies. In the 0.8-μm rule, the DRAM macro has a 32-K×9-b configuration in a silicon area of 1.7×5.0 mm2 . It achieves a 27-ns access and a 50-ns cycle times. The other DRAM macro in the 0.5-μm technology is organized in 64 K×18 b. It has a macro area of 2.1×4.9 mm and demonstrated a 23-ns access and a 40-ns cycle times. Small densities and multiple bit data configurations provide a flexibility to ASIC designs and a wide variety of application capabilities. Multiple uses of the DRAM macros bring significant performance leverages to ASIC chips because of the wide data bus and the fast access and cycle times. A data rate more than 1.3 Gb/s is possible by a single chip. Some examples of actual DRAM macro embedded ASIC chips are shown
  • Keywords
    CMOS digital integrated circuits; DRAM chips; application specific integrated circuits; integrated circuit design; 0.5 micron; 0.8 micron; 1.3 Gbit/s; 16 Mbit; 23 to 50 ns; 4 Mbit; ASIC chips; CMOS ASIC applications; CMOS logic merged process technologies; DRAM macros; capacitor plates; grounded substrate; one transistor trench cells; Application specific integrated circuits; CMOS process; CMOS technology; Capacitors; Costs; Logic circuits; Random access memory; Silicon; Substrates; Transistors;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.406409
  • Filename
    406409