DocumentCode
968889
Title
Development of a Digital-Convolution-Based Process Emulator for Three-Dimensional Microstructure Fabrication Using Electron-Beam Lithography
Author
Yeh, Hsiu-Ming ; Chen, Kuo-Shen
Author_Institution
Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan
Volume
56
Issue
4
fYear
2009
fDate
4/1/2009 12:00:00 AM
Firstpage
926
Lastpage
936
Abstract
Although electron-beam lithography has been demonstrated to be feasible in creating 3-D micropolymer structures, the proximity effect due to forward and backward scatterings usually makes it difficult to precisely determine the distribution of electron irradiation. The process design for creating the desired shape still largely depends on a trial-and-error basis. Therefore, in order to reduce the cost and to accelerate product development, it is important to utilize computer-aided design tools. A method, called as element growth method, which is based on digital convolution approach, is developed and presented under an OpenGL environment to reduce the cost and the developmental period for fabrication. By using such a convolution approach, this emulator converts the processing parameters into a final spatial-dosage distribution and subsequently into the final geometry of structures. In addition, a physically based kernel function is also proposed and used. Examples of 3-D microstructures such as the microlens are presented. By these tools, it is possible to provide guidelines for optimizing the fabrication process and to reduce the cost for the related e-beam lithography-based 3-D fabrication.
Keywords
convolution; crystal microstructure; electron beam lithography; electron radiation; electronic design automation; proximity effect (lithography); 3-D micropolymer structures; 3-D microstructures; CAD; OpenGL environment; backward scatterings; computer-aided design tools; digital-convolution-based process emulator; e-beam lithography; electron irradiation distribution; electron-beam lithography; element growth method; forward scatterings; kernel function; product development; proximity effect; three-dimensional microstructure fabrication; Computer-aided design (CAD); electron-beam lithography (EBL); microfabrication; process simulation;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/TIE.2008.2006030
Filename
4663109
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