A Near-Field Probe for In Situ EMI Measurements of Industrial Installations

Author

Quilez, Marcos ; Aragon, M. ; Atienza, Andreu ; Fernandez-Chimeno, M. ; Riu, Pere J. ; Silva, Ferran

Author_Institution

Electromagn. Compatibility Group (GCEM), Tech. Univ. of Catalonia (UPC), Barcelona

Volume

50

Issue

4

fYear

2008

Firstpage

1007

Lastpage

1010

Abstract

In this paper, we present a frequency-selective probe intended to measure E and H fields simultaneously in the near-field region. The probe is implemented on a printed circuit board (PCB) that provides some advantages compared to those presented in previous works. The existing theoretical models are adapted in order to include the effect of both PCB trace and dielectric support. The probe is used for in situ electromagnetic compatibility (EMC) characterization of industrial installations, which offers valuable information that cannot be obtained by the usual EMC measurements.

Keywords

electric variables measurement; electromagnetic compatibility; printed circuits; probes; electromagnetic compatibility; frequency-selective probe; in situ EMI measurements; industrial installations; near-field probe; printed circuit board; Dielectric measurements; Distortion measurement; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic radiation; Frequency measurement; Magnetic field measurement; Near-field radiation pattern; Power measurement; Printed circuits; Probes; in situ measurement; Industrial installations; in situ measurement; near field;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2008.2004610

Filename

4663117