DocumentCode
969252
Title
Fundamental Analysis of Cu Brush-Ag Slip Ring Sliding Electrical Contacts
Author
Garshasb, Masoud ; Vook, Richard W.
Author_Institution
Engelhard Industries,Plainville,MA
Volume
9
Issue
1
fYear
1986
fDate
3/1/1986 12:00:00 AM
Firstpage
23
Lastpage
29
Abstract
Electrical contacts involving current-carrying copper-wire brushes sliding on a sputter-cleaned silver slip ring and rotating in an ambient of 1 atm of wet CO2 were characterized by Auger electron spectroscopy (AES), scanning electron microscopy (SEM), X-ray energy spectroscopy (XES), reflection high-energy electron diffraction (RHEED), and in situ measurements of contact resistance. AES analysis of the slip rings showed 1) carbon formation at the contact zone and 2) increasing amounts of Cu transfer from the brushes to the slip ring with increasing contact current. SEM and XES analyses of the brushes, slip ring, and wear particles showed that the copper content of the wear particles and the copper concentration of the slip ring surface increased with increasing contact current. RHEED studies of the wear particles showed that higher currents resulted in larger grain sizes. Initially, high values of the contact resistance decreased to fractions of a milliohm, and then after approximately 2000 cycles, gradually became more erratic as the contact deteriorated. This deterioration was caused by the accumulation of Ag debris on the Cu brush ends.
Keywords
Brushes; Contacts, mechanical factors; Brushes; Contact resistance; Copper; Current measurement; Electrical resistance measurement; Reflection; Scanning electron microscopy; Silver; Spectroscopy; X-ray diffraction;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1986.1136627
Filename
1136627
Link To Document