• DocumentCode
    969337
  • Title

    Solution of Wire Creep Rupture Problem in a Thick-Film Power Hybrid

  • Author

    Honeycutt, J.O. ; Mace, E.W.

  • Author_Institution
    IBM Corp,Austin, TX
  • Volume
    9
  • Issue
    2
  • fYear
    1986
  • fDate
    6/1/1986 12:00:00 AM
  • Firstpage
    172
  • Lastpage
    180
  • Abstract
    Surviving 2000 thermal shock cycles from 0 to 125°C without bonding wire deterioration in a plastic-encapsulated power hybrid requires judicious selection of materials and processes. Power hybrid modules under development had reached the preproduction and qualification test phase and began exhibiting wire failure within 200 thermal shock cycles. The wire failures occurred within two to three wire diameters above the ball in thermosonic bonded 0.025- and 0.051-mm wire. The problem was determined to be one of creep rupture wherein the wire was being subjected to repeated thermal and mechanical stressing during assembly and test. The module, the materials of construction, and the methods whereby the problem was identified and resolved are · described.
  • Keywords
    Power semiconductor devices; Thick-film circuit reliability; Thick-film circuit thermal factors; Assembly; Bonding; Building materials; Creep; Electric shock; Modular construction; Qualifications; Testing; Thermal stresses; Wire;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1986.1136635
  • Filename
    1136635