• DocumentCode
    969650
  • Title

    Confidence-based active learning

  • Author

    Mingkun Li ; Sethi, I.K.

  • Author_Institution
    DOE Joint Genome Inst., Lawrence Berkeley Nat. Lab., Walnut Creek, CA
  • Volume
    28
  • Issue
    8
  • fYear
    2006
  • Firstpage
    1251
  • Lastpage
    1261
  • Abstract
    This paper proposes a new active learning approach, confidence-based active learning, for training a wide range of classifiers. This approach is based on identifying and annotating uncertain samples. The uncertainty value of each sample is measured by its conditional error. The approach takes advantage of current classifiers´ probability preserving and ordering properties. It calibrates the output scores of classifiers to conditional error. Thus, it can estimate the uncertainty value for each input sample according to its output score from a classifier and select only samples with uncertainty value above a user-defined threshold. Even though we cannot guarantee the optimality of the proposed approach, we find it to provide good performance. Compared with existing methods, this approach is robust without additional computational effort. A new active learning method for support vector machines (SVMs) is implemented following this approach. A dynamic bin width allocation method is proposed to accurately estimate sample conditional error and this method adapts to the underlying probabilities. The effectiveness of the proposed approach is demonstrated using synthetic and real data sets and its performance is compared with the widely used least certain active learning method
  • Keywords
    learning (artificial intelligence); pattern classification; sampling methods; support vector machines; classifier training; conditional error; confidence-based active learning; dynamic bin width allocation method; least certain active learning method; support vector machines; uncertain samples; uncertainty value estimation; user-defined threshold; Computational complexity; Costs; Error analysis; Learning systems; Machine learning; Pattern classification; Robustness; Support vector machine classification; Support vector machines; Uncertainty; Active learning; error estimation; pattern classification; support vector machines.; Algorithms; Artificial Intelligence; Computer Simulation; Confidence Intervals; Information Storage and Retrieval; Models, Statistical; Pattern Recognition, Automated;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2006.156
  • Filename
    1642660