• DocumentCode
    969733
  • Title

    A low-voltage 40-GHz complementary VCO with 15% frequency tuning range in SOI CMOS technology

  • Author

    Fong, Neric ; Kim, Jonghae ; Plouchart, Jean-Olivier ; Zamdmer, Noah ; Liu, Duixian ; Wagner, Lawrence ; Plett, Calvin ; Tarr, Garry

  • Author_Institution
    Cognio Canada Inc., Ottawa, Ont., Canada
  • Volume
    39
  • Issue
    5
  • fYear
    2004
  • fDate
    5/1/2004 12:00:00 AM
  • Firstpage
    841
  • Lastpage
    846
  • Abstract
    The design of a low-voltage 40-GHz complementary voltage-controlled oscillator (VCO) with 15% frequency tuning range fabricated in 0.13-μm partially depleted silicon-on-insulator (SOI) CMOS technology is reported. Technological advantages of SOI over bulk CMOS are demonstrated, and the accumulation MOS (AMOS) varactor limitations on frequency tuning range are addressed. At 1.5-V supply, the VCO core and each output buffer consumes 11.25 mW and 3 mW of power, respectively. The measured phase noise at 40-GHz is -109.73 dBc/Hz at 4-MHz offset from the carrier, and the output power is -8 dBm. VCO performance using high resistivity substrate (∼300-Ω·cm) has the same frequency tuning range but 2 dB better phase noise compared with using low resistivity substrate (10 Ω·cm). The VCO occupies a chip area of only 100 μm by 100 μm (excluding pads).
  • Keywords
    CMOS integrated circuits; circuit tuning; field effect MIMIC; integrated circuit design; low-power electronics; silicon-on-insulator; voltage-controlled oscillators; 0.13 microns; 1.5 V; 11.25 mW; 3 mW; 40 GHz; CMOS technology; SOI; accumulation MOS varactor; frequency tuning; high resistivity substrate; low-voltage complementary VCO; partially depleted silicon-on-insulator; phase noise; voltage-controlled oscillator; CMOS technology; Conductivity; Frequency; Noise measurement; Phase noise; Power measurement; Silicon on insulator technology; Tuning; Varactors; Voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2004.826341
  • Filename
    1291690