Title :
Input VSWR of profiled E-plane tapers
Author :
Birand, M.T. ; Williams, N.
Author_Institution :
ERA Technology Ltd, Leatherhead, UK
Abstract :
An efficient method for determining the input VSWR characteristics of waveguide E-plane tapers is presented. The taper profile is approximated by radial waveguide sections and the junction wave transfer matrices are derived applying field matching. The input reflection coefficient is easily determined using these matrices. Results computed using the present method are compared with some measured and calculated results in the literature and very good agreement is obtained.
Keywords :
waveguide components; waveguide theory; waveguides; field matching; input VSWR characteristics; junction wave transfer matrices; radial waveguide sections; waveguide E-plane tapers;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810156