• DocumentCode
    969894
  • Title

    Fault detection in combinational circuits using Gunn effect logic devices

  • Author

    Saluja, K.K. ; Lidgey, F.J.

  • Author_Institution
    University of Newcastle, Department of Electrical & Computer Engineering, Newcastle, Australia
  • Volume
    17
  • Issue
    6
  • fYear
    1981
  • Firstpage
    222
  • Lastpage
    223
  • Abstract
    It is shown that certain realisations of combinational switching functions using Gunn effect logic gates can be tested for single or multiple stuck-type faults by using two tests only. This result is achieved by exploiting the fact that the function of Gunn effect logic gates is sensitive to bias voltage
  • Keywords
    Gunn devices; combinatorial circuits; fault location; logic gates; Gunn effect logic devices; bias voltage; combinational circuits; fault detection;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19810157
  • Filename
    4245622
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=969894